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Download Advanced Computing in Electron Microscopy by Earl J. Kirkland PDF

By Earl J. Kirkland

Preface to moment version a number of new subject matters were extra, a few small error were corrected and a few new references were additional during this version. New themes comprise aberration corrected tools, scanning confocal mode of operations, Bloch wave eigenvalue tools and parallel computing suggestions. The ?rst version - cluded a CD with desktop courses, which isn't integrated during this variation. - stead the linked courses should be on hand on an linked site (currently╦ťkirkland,but may perhaps flow as time is going on). I desire to thank Mick Thomas for getting ready the specimen used to checklist the picture in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an engaging organic specimen to exploit in Fig.7.24. back, I ask for forgiveness upfront for leaving out a few undoubtedlyoutstanding r- erences. I additionally make an apology for the as but undiscovered error that stay within the textual content. Earl J. Kirkland, December 2009 Preface to First variation snapshot simulation has turn into a standard device in HREM (High solution El- tron Microscopy) in recent times. although, the literature at the topic is scattered between many various journals and convention lawsuits that experience happened within the final or 3 many years. it really is dif?cult for newbies to start during this ?eld.

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The specimen scatters at an angle )'k and the final angle into the objective lens is 0 (angles measured with respect to the optic axis). A single electron trajectory is shown on the left and the total illumination of a single point on the image is shown on the right. (3max is typically the condenser aperture and Omax is the objective aperture. optic axis). Note that k,e is a two dimensional vector because (3 can vary in both the polar and azimuthal directions. 19) 'l/Jt(x) = t(x) exp(2rrik,e . x) Usually the condenser system will deliver a small cone of illumination angles onto the specimen.

9 for various value of defocus and objective aperture. The graph has been scaled to make hADF(O) = 1. 43{Cs A3)1/4. 4. ANNULAR DARK FIELD STEM 37 (a) 'Iii a. (b) 'Iii a. 9: The STEM probe intensity (approximate point spread function) when astigmatism is negligible versus normalized radius R = r(CsA3)-1/4 for various values of the normalized defocus D = /:If(C s A)-1/2 and objective aperture Kmax = kmax(CsA3)1/4. 5 The transfer function is just the inverse Fourier transform of the point spread function.

Performing a two dimensional FFT on real valued data is easiest using the second of these methods. 19) fc(x) is now in the form that can be used in a single FFT to produce N complex valued Fourier coefficients. The trick is to untangle the Fourier transform of fa(x) from that of fb(X). 25) If there are N real values in each of fa(x) and fb(X) then there are N complex values in fc(x) and Fc(k). 27) To calculate a two dimensional Fourier transform of N x x Ny real valued data points, first calculate the Fourier transform of all of the Ny columns two at a time, yielding Ny complex arrays of length N x /2.

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